Semiconductor Test Consortium (STC) Austin Meeting

The next STC meeting will focus on three Semiconductor Test Interface eXtensions (STIX) Working Groups. The majority of the time will be spent in separate WG breakout meetings working towards developing open specifications. The breakout WGs are:

Portable Test Instrument Module (PTIM) - Standardization of a module interface, which could be used in different ATE architectures.
Yield Enhancement Analysis Tools - Standardize on some handshake for how to interact with equipment. This would be linked to a consistent API.
Probe card - Promote standardization to enable test cost reductions, increase yield, shorten probe card design and manufacturing time.

For more information and to register to attend, go to http://www.semitest.org/home and click on the Austin meeting in the "Upcoming Events" section.